Vetenskap & teknik
Advanced Materials Characterization
Ch Sateesh Kumar • M Muralidhar Singh • Ram Krishna
Inbunden
2039:-
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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features: Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
- Illustratör: black and white 57 Illustrations 52 Line drawings, black and white 5 Halftones black and white
- Format: Inbunden
- ISBN: 9781032375106
- Språk: Engelska
- Antal sidor: 130
- Utgivningsdatum: 2023-05-04
- Förlag: CRC Press