bokomslag Advances in X-Ray Analysis
Vetenskap & teknik

Advances in X-Ray Analysis

John B Newkirk Gavin R Mallett

Pocket

769:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 10-16 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 558 sidor
  • 2012
The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
  • Författare: John B Newkirk, Gavin R Mallett
  • Format: Pocket/Paperback
  • ISBN: 9781468478372
  • Språk: Engelska
  • Antal sidor: 558
  • Utgivningsdatum: 2012-06-12
  • Förlag: Springer-Verlag New York Inc.