bokomslag Bias Temperature Instability for Devices and Circuits
Vetenskap & teknik

Bias Temperature Instability for Devices and Circuits

Tibor Grasser

Pocket

1649:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 7-12 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 810 sidor
  • 2016
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
  • Författare: Tibor Grasser
  • Format: Pocket/Paperback
  • ISBN: 9781493955299
  • Språk: Engelska
  • Antal sidor: 810
  • Utgivningsdatum: 2016-10-01
  • Förlag: Springer-Verlag New York Inc.