Kommande
bokomslag CMOS Plasma and Process Damage
Data & IT

CMOS Plasma and Process Damage

Kirk Prall

Inbunden

2809:-

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  • 500 sidor
  • 2025
This book discusses the complex technology of building CMOS computer chips and covers some of the unusual problems that can occur during chip manufacturing. Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.
  • Författare: Kirk Prall
  • Format: Inbunden
  • ISBN: 9783031890284
  • Språk: Engelska
  • Antal sidor: 500
  • Utgivningsdatum: 2025-05-22
  • Förlag: Springer International Publishing AG