CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies 1
bokomslag CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Data & IT

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Andrei Pavlov • Manoj Sachdev

Pocket

2369:-

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Andra format:

  • 194 sidor
  • 2010
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.
  • Författare: Andrei Pavlov, Manoj Sachdev
  • Format: Pocket/Paperback
  • ISBN: 9789048178551
  • Språk: Engelska
  • Antal sidor: 194
  • Utgivningsdatum: 2010-10-28
  • Förlag: Springer

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