Combat Identification Modeling Using Robust Optimization Techniques 1
bokomslag Combat Identification Modeling Using Robust Optimization Techniques
Psykologi & pedagogik

Combat Identification Modeling Using Robust Optimization Techniques

Taeho Kim

Pocket

829:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 7-12 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

  • 2012
  • Författare: Taeho Kim
  • Format: Pocket/Paperback
  • ISBN: 9781288327676
  • Språk: Engelska
  • Utgivningsdatum: 2012-11-21
  • Förlag: Biblioscholar

Du kanske gillar

  1. bokomslag Deep Learning Foundations

    Deep Learning Foundations

    Taeho Jo

    Inbunden

    2569:-
  2. bokomslag Proceedings of AAIA the 1st Universal Conference on Artificial Intelligence

    Proceedings of AAIA the 1st Universal...

    Taeho Jo

    Pocket

    3609:-
  3. bokomslag Atomic Nanoscale Technology in the Nuclear Industry

    Atomic Nanoscale Technology in the Nu...

    Taeho Woo

    Pocket

    1509:-
  4. bokomslag Machine Learning Foundations

    Machine Learning Foundations

    Taeho Jo

    Pocket

    2139:-
  5. bokomslag Python Programming

    Python Programming

    Taeho Jo

    Pocket

    899:-
  6. bokomslag Atomic Information Technology

    Atomic Information Technology

    Taeho Woo

    1429:-
  7. bokomslag Machine Learning Foundations

    Machine Learning Foundations

    Taeho Jo

    Inbunden

    2139:-
  8. bokomslag Atomic Information Technology

    Atomic Information Technology

    Taeho Woo

    Inbunden

    1429:-
  9. bokomslag Text Mining

    Text Mining

    Taeho Jo

    2259:-
  10. bokomslag Atomic Nanoscale Technology in the Nuclear Industry

    Atomic Nanoscale Technology in the Nu...

    Taeho Woo

    Inbunden

    3769:-

Andra av samma författare

  1. bokomslag Reliability, Yield, and Stress Burn-In

    Reliability, Yield, and Stress Burn-In

    Way Kuo, Wei-Ting Kary Chien, Taeho Kim

    Inbunden

    2139:-
  2. bokomslag Reliability, Yield, and Stress Burn-In

    Reliability, Yield, and Stress Burn-In

    Way Kuo, Wei-Ting Kary Chien, Taeho Kim

    Pocket

    2139:-