bokomslag Defect and Microstructure Analysis by Diffraction
Vetenskap & teknik

Defect and Microstructure Analysis by Diffraction

Robert Snyder

Inbunden

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  • 808 sidor
  • 2000
This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.
  • Författare: Robert Snyder
  • Illustratör: numerous line figures
  • Format: Inbunden
  • ISBN: 9780198501893
  • Språk: Engelska
  • Antal sidor: 808
  • Utgivningsdatum: 2000-01-01
  • Förlag: OUP Oxford