bokomslag Design, Analysis and Test of Logic Circuits Under Uncertainty
Data & IT

Design, Analysis and Test of Logic Circuits Under Uncertainty

Smita Krishnaswamy Igor L Markov John P Hayes

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  • 124 sidor
  • 2012
Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
  • Författare: Smita Krishnaswamy, Igor L Markov, John P Hayes
  • Format: Inbunden
  • ISBN: 9789048196432
  • Språk: Engelska
  • Antal sidor: 124
  • Utgivningsdatum: 2012-09-21
  • Förlag: Springer