bokomslag Electromigration Inside Logic Cells
Data & IT

Electromigration Inside Logic Cells

Gracieli Posser Sachin S Sapatnekar Ricardo Reis

Pocket

759:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 10-16 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 118 sidor
  • 2018
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
  • Författare: Gracieli Posser, Sachin S Sapatnekar, Ricardo Reis
  • Format: Pocket/Paperback
  • ISBN: 9783319840413
  • Språk: Engelska
  • Antal sidor: 118
  • Utgivningsdatum: 2018-07-05
  • Förlag: Springer International Publishing AG