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ETVC2008,thefallcolloquiumofthecomputersciencedepartment(LIX)ofthe ' Ecole Polytechnique, held in Palaiseau, France, November 18-20, 2008, focused ontheEmergingTrendsinVisualComputing.Thecolloquiumgavescientiststhe opportunity to sketch a state-of-the-artpicture of the mathematical foundations of visual computing. We weredelightedto invite andwelcome the followingdistinguishedspeakers to ETVC 2008 (listed in alphabetical order): - Shun-ichi AMARI (Mathematical Neuroscience Laboratory, Brain Science Institute, RIKEN, Wako-Shi, Japan): Information Geometry and Its Applications - Tetsuo ASANO (School of Information Science, Japan Advanced Institute of Science and Technology, JAIST, Japan): Constant-Working-Space Al- rithms for Image Processing - Francis BACH (INRIA/ENS, France): Machine Learning and Kernel Me- ods for Computer Vision - Fr' ed' eric BARBARESCO (Thales Air Systems, France): Applications of - formation Geometry to Radar Signal Processing - Michel BARLAUD (I3S CNRS, University of Nice-Sophia-Antipolis, Po- tech'Nice & Institut Universitaire de France, France): Image Retrieval via Kullback Divergence of Patches of Wavelets Coe?cients in the k-NN Framework - Jean-Daniel BOISSONNAT (GEOMETRICA, INRIA Sophia-Antipolis, France): Certi? ed Mesh Generation - Pascal FUA (EPFL, CVLAB, Switzerland): Recovering Shape and Motion from Video Sequences - Markus GROSS (Department of Computer Science, Institute of Scienti?c Computing, Swiss Federal Institute of Technology Zurich, ETHZ, Switz- land): 3D Video: A Fusion of Graphics and Vision - Xianfeng David GU (State University of New York at Stony Brook, USA): Discrete Curvature Flow for Surfaces and 3-Manifolds - Leonidas GUIBAS (Computer Science Department, Stanford University, USA): Detection of Symmetries and Repeated Patterns in 3D Point Cloud Data - Sylvain LAZARD (VEGAS, INRIA LORIA Nancy, France): 3D Visibility and Lines in Space VI Preface '
- Format: Pocket/Paperback
- ISBN: 9783642008252
- Språk: Engelska
- Antal sidor: 386
- Utgivningsdatum: 2009-03-26
- Förlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. K