Kommande
bokomslag Future-Oriented Technology Assessment
Samhälle & debatt

Future-Oriented Technology Assessment

Haydar Yalcin Tugrul U Daim

Inbunden

1769:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

  • 432 sidor
  • 2024
Comprehensive resource explaining how to evaluate technologies for different purposes in any industry using four different practical approaches Future-Oriented Technology Assessment offers a comprehensive view of technology assessment structured into three different practical approaches: Technology Evaluation, Technology Roadmapping, and Technology Intelligence. The first four chapters include studies which utilize technology gap analysis, multiple criteria decision analysis, expert assessment quantification or neural networks to evaluate or forecast technology alternatives. The next five chapters apply bibliometric analysis, patent analysis, and network analysis to identify technology trends and the leaders in the field. The final four chapters use technology roadmapping, which charts a comprehensive plan for implementing technology. Additional topics covered in Future-Oriented Technology Assessment include: Smart grid technology as an alternative to fossil fuel consumption Heat pump water heaters that reduce the cost of energy and improve energy efficiency, with particular focus on research from the US and China Nanotechnology in construction in Saudi Arabia to improve heat insulation, energy efficiency, and tensile strength in green building designs With comprehensive, practical insight into evaluating emerging technologies across different industries, Future-Oriented Technology Assessment is an essential read for researchers in technology and professionals in engineering and technology management, along with professionals and graduate students in related disciplines and programs of study.
  • Författare: Haydar Yalcin, Tugrul U Daim
  • Format: Inbunden
  • ISBN: 9781119909859
  • Språk: Engelska
  • Antal sidor: 432
  • Utgivningsdatum: 2024-11-25
  • Förlag: Wiley-IEEE Press