Microelectronic Reliability: v. 1 Reliability, Test and Diagnostics 1

Vetenskap & teknik

Microelectronic Reliability: v. 1 Reliability, Test and Diagnostics

Name: Microelectronic Reliability: v. 1 Reliability, Test and Diagnostics
Price: 2759 SEK
Availability: InStock
Author: Edward B Hakim
ISBN: 9780890062845

Edward B Hakim

Inbunden

2759:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 7-12 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

396 sidor
1989

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

Författare: Edward B Hakim
Format: Inbunden
ISBN: 9780890062845
Språk: Engelska
Antal sidor: 396
Utgivningsdatum: 1989-01-01
Förlag: Artech House Publishers