bokomslag Modeling Nanoscale Imaging in Electron Microscopy
Vetenskap & teknik

Modeling Nanoscale Imaging in Electron Microscopy

Thomas Vogt Wolfgang Dahmen Peter Binev

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  • 182 sidor
  • 2014
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
  • Författare: Thomas Vogt, Wolfgang Dahmen, Peter Binev
  • Format: Pocket/Paperback
  • ISBN: 9781489997289
  • Språk: Engelska
  • Antal sidor: 182
  • Utgivningsdatum: 2014-04-13
  • Förlag: Springer-Verlag New York Inc.