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Modular Multilevel Converters Expert discussions of cutting-edge methods used in MMC control, protection, and fault detection In Modular Multilevel Converters: Control, Fault Detection, and Protection, a team of distinguished researchers delivers a comprehensive discussion of fault detection, protection, and tolerant control of modular multilevel converters (MMCs) under internal and external faults. Beginning with a description of the configuration of MMCs, their operation principles, modulation schemes, mathematical models, and component design, the authors go on to explore output control, fault detection, capacitor monitoring, and other topics of central importance in the field. The book offers summaries of centralized capacitor voltage-balancing control methods and presents several capacitor monitoring methods, like the direct and sorting-based techniques. It also describes full-bridge and half-bridge submodule-based hybrid MMC protection methods and alternative fault blocking SM-based MMCs. Readers will also find: A thorough introduction to modular multilevel converters, including circuits, operation principles, modulation, mathematical models, components, and design constraints In-depth discussions of the control of modular multilevel converters, including output control, centralized capacitor voltage control, and individual capacitor voltage control Comprehensive explorations of fault detection of MMCs under IGBT faults, including short-circuit and open-circuit faults, as well as fault-tolerant control of MMCs Fulsome treatments of the control of MMCs under AC grid faults, including discussions of AC-side current control Perfect for electrical engineering researchers, Modular Multilevel Converters: Control, Fault Detection, and Protection, will also earn a place in the libraries of electrical engineers working in industry, as well as undergraduate and graduate students with an interest in MMCs.
- Format: Inbunden
- ISBN: 9781119875604
- Språk: Engelska
- Antal sidor: 368
- Utgivningsdatum: 2023-03-27
- Förlag: Wiley-IEEE Press