bokomslag Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Vetenskap & teknik

Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

Ronald D Schrimpf Daniel M Fleetwood

Inbunden

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  • 348 sidor
  • 2004
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
  • Författare: Ronald D Schrimpf, Daniel M Fleetwood
  • Illustratör: Illustrations
  • Format: Inbunden
  • ISBN: 9789812389404
  • Språk: Engelska
  • Antal sidor: 348
  • Utgivningsdatum: 2004-08-01
  • Förlag: World Scientific Publishing Co Pte Ltd