Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization 1

Vetenskap & teknik

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Chandra Shakher Pathak • Samir Kumar

Inbunden

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274 sidor
2022

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Författare: Chandra Shakher Pathak, Samir Kumar
Format: Inbunden
ISBN: 9781839682292
Språk: Engelska
Antal sidor: 274
Utgivningsdatum: 2022-01-07
Förlag: IntechOpen