bokomslag Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Vetenskap & teknik

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Zhong Lin Wang

Inbunden

2869:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 5-10 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 458 sidor
  • 1996
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.
  • Författare: Zhong Lin Wang
  • Format: Inbunden
  • ISBN: 9780521482660
  • Språk: Engelska
  • Antal sidor: 458
  • Utgivningsdatum: 1996-05-01
  • Förlag: Cambridge University Press