Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints 1
bokomslag Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints
Vetenskap & teknik

Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints

Steve Kupke

Pocket

439:-

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  • 2016
  • Författare: Steve Kupke
  • Format: Pocket/Paperback
  • ISBN: 9783741208690
  • Språk: Engelska
  • Utgivningsdatum: 2016-06-06
  • Förlag: Books on Demand

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