Vetenskap & teknik
SQUID '80. Superconducting Quantum Interference Devices and their Applications
H D Hahlbohm • H Lubbig
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Frontmatter -- PREFACE -- CONTENTS -- LIST OF PARTICIPANTS -- JOSEPHSON JUNCTION PHYSICS -- PROGRESS IN PHYSICS OF JOSEPHSON JUNCTIONS / Lübbig, H. -- NON-EQUILIBRIUM PHENOMENA IN JOSEPHSON JUNCTIONS / Hansen, J. Bindslev / Lindelof, P.E. -- STUDY OF A SPIN-GLASS PHASE TRANSITION BY THE DC JOSEPHSON EFFECT / Van Haesendonck, C. / Van den dries, L. / Bruynseraede, Y. / Gilabert, A. -- CHARACTERIZATION OP NON EQUILIBRIUM SUPERCONDUCTIVITY VIA THE JOSEPHSON EFFECT / Gilabert, A. / Vanneste, C. / Sibillot, P. / Ostrowsky, D. -- LOCALLY LOWERED TUNNELING BARRIERS IN LIGHT-SENSITIVE JOSEPHSON JUNCTIONS / Russo, M. -- PREPARATION PARAMETERS AND CHARACTERIZATION OF VANADIUM BASED JOSEPHSON JUNCTIONS / Barone, A. / Russo, M. / Chiara, A. Di / Peluso, C. -- MEASUREMENT OF THE COS - AMPLITUDE OF NIOBIUM POINT CONTACTS CONTAINED IN A RF- SQUID / Erne, S.N. / Luther, H. / Scheer, H.J. -- AN ELECTRONIC ANALOGUE OF A HIGH FREQUENCY THEORY OF THE JOSEPHSON EFFECT / Jablonski, D.G. / Waldram, J.R. -- SUPERCURRENT INTERFERENCE PATTERNS AND QUASIPARTICLE EXCESS CURRENTS IN JOSEPHSON TUNNEL JUNCTIONS / Epperlein, P. W. -- MAGNETIC FIELD BEHAVIOR OF CURRENT STEPS IN LONG JOSEPHSON JUNCTIONS / Costabile, G. / Cucolo, A. M. / Pace, S. / Parmentier, R. D. / Savo, B. / Vaglio, R. -- PROPERTIES OF COHERENT VORTEX MOTION IN Pb-Nb-Pb ION IMPLANT VARIABLE THICKNESS BRIDGES / Crozat, P. / Vernet, G. / Adde, R. -- THE EFFECT OF MAGNETIC FIELD ON THE HEIGHT OF MICROWAVE-INDUCED STEP / Chong-de, Wei / Jia-zhang, Li -- THE CURRENT-PHASE RELATION OP SUPERCONDUCTING BRIDGES / Xi-Xian, Yao -- SUB-HARMONIC STEPS OF SUPERCONDUCTING BRIDGES / Xi-Xian, Yao -- EFFECTS OF MICROWAVE RADIATION ON GRANULAR Al MICROBRIDGES / Dwir, B. / Deutscher, G. -- JUNCTION AND CIRCUIT NOISE -- FLUCTUATIONS ANALYSIS / Clarke, John -- QUANTUM LIMITED AC-BIASED SQUID MAGNETOMETER / Long, A. P. / Prance, R. J. / Clark, T. D. / Mutton, J. E. / Potts, M. W. / Widom, A. / Goodall, F. -- ON THE ØDC-DEPENDENCE OF RF-SQUID NOISE / Cristiano, R. / Erné, S. N. / Luther, H. -- THE PLASMA RESONANCE IN THE RF IMPEDANCE AND THE WIDE-BAND RESPONSE OF A CAPACITIVELY SHUNTED JOSEPHSON JUNCTION / Poorter, T. / Tolner, H. -- LOW FREQUENCY NOISE IN SMALL-AREA TUNNEL JUNCTION dc SQUIDs / Ketchen, M. B. / Tsuei, C. C. -- THERMODYNAMIC EQUILIBRIUM FLUCTUATIONS GENERATED BY A JOSEPHSON TUNNEL JUNCTION DESCRIBED BY THE WERTHAMER THEORY / Brunk, G. -- QUANTUM VERSUS THERMALLY EXCITED FLUXOID TRANSITIONS IN A SQUID RING / Kurkijärvi, J. -- JUNCTION AND CIRCUIT FABRICATION -- JUNCTION AND CIRCUIT FABRICATION / Jackel, L. D. -- HIGH RELIABILITY PB-ALLOY JOSEPHSON JUNCTIONS FOR INTEGRATED CIRCUITS / Huang, H.-C. W. / Basavaiah, S. / Kircher, C. J. / Harris, E. P. / Murakami, M. / Klepner, S. / Greiner, J. H. -- SUPERCONDUCTIVE TUNNELING THROUGH EDGE-GROWN BARRIERS / Dousselin, G. / Rosenblatt, J. -- REFRACTORY WEAK LINK JOSEPHSON DEVICES / Claassen, J. H. / Cukauskas, E. J. / Nisenoff, M. -- FABRICATION AND CHARACTERIZATION OF THE FILM PARAMETERS IN ION-IMPLANT Nb BRIDGES WITH THICK Pb BANKS / Crozat, P. / Adde, R. -- NB WEAK LINKS FOR SQUID APPLICATIONS / Laibowitz, R. B. / Broers, A. N. / Voss, R. F. / Raider, S. I. / Viggiano, J. M. -- ULTRA LOW NOISE DC SQUIDS / Voss, R. F. / Laibowitz, R. B. / Ketchen, M. B. / Broers, A. N. -- SOME PROPERTIES OF Nb2O5 THERMALLY GROWN TUNNEL BARRIERS IN Nb-Nb2O5-Pb(In) JOSEPHSON JUNCTIONS / Villegier, J. C. / Matheron, G. -- DC SQUIDS FABRICATED WITH NIOBIUM-NIOBIUM TUNNEL JUNCTIONS / Waal, V. J. de / Hamer, P. van den / Mooij, J. E. -- FABRICATION AND CHARACTERIZATION OF THERMALLY RECYCLABLE SUBMICRON NIOBIUMNIOBIUM JOSEPHSON JUNCTIONS / Daalmans, G. M. -- SIMPLE FABRICATION AND CHARACTERIZATION OF THIN-FILM NIOBIUM SQUID'S WORKING AT 4.2 K / Pascal, D. -- CRYOGENIC TECHNIQUES -- CRYOGENICS FOR SQUIDs / Zimmerman, James E. -- FUNDAMENTALS FOR SQUID APPLICATIONS -- FUNDAMENTALS FOR SQUID APPLICATIONS / Giffard, R. P. -- SIGNAL AND NOISE PARAMETERS OF SQUIDs / Danilov, V. V. /
- Format: Inbunden
- ISBN: 9783110080636
- Språk: Engelska
- Antal sidor: 1017
- Utgivningsdatum: 1980-03-01
- Förlag: De Gruyter