bokomslag Stuck
Historia

Stuck

Margaret M Chin

Inbunden

439:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 5-10 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 224 sidor
  • 2020
Winner, 2022 Max Weber Award for Distinguished Scholarship, given by the American Sociological Association's Section on Organizations, Occupations, and Work Winner, 2021 PROSE Award in the Business, Finance & Management Category A behind-the-scenes examination of Asian Americans in the workplace In the classroom, Asian Americans, often singled out as so-called model minorities, are expected to be top of the class. Often they are, getting straight As and gaining admission to elite colleges and universities. But the corporate world is a different story. As Margaret M. Chin reveals in this important new book, many Asian Americans get stuck on the corporate ladder, never reaching the top. In Stuck, Chin shows that there is a bamboo ceiling in the workplace, describing a corporate world where racial and ethnic inequalities prevent upward mobility. Drawing on interviews with second-generation Asian Americans, she examines why they fail to advance as fast or as high as their colleagues, showing how they lose out on leadership positions, executive roles, and entry to the coveted boardroom suite over the course of their careers. An unfair lack of trust from their coworkers, absence of role models, sponsors and mentors, and for women, sexual harassment and prejudice especially born at the intersection of race and gender are only a few of the factors that hold Asian American professionals back. Ultimately, Chin sheds light on the experiences of Asian Americans in the workplace, providing insight into and a framework of who is and isnt granted access into the upper echelons of American society, and why.
  • Författare: Margaret M Chin
  • Format: Inbunden
  • ISBN: 9781479816811
  • Språk: Engelska
  • Antal sidor: 224
  • Utgivningsdatum: 2020-08-18
  • Förlag: New York University Press