Data & IT
Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Takashi Nakamura • Eishi Ibe • Mamoru Baba • Yasuo Yahagi • Hideaki Kameyama
Inbunden
2369:-
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Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
- Format: Inbunden
- ISBN: 9789812778819
- Språk: Engelska
- Antal sidor: 368
- Utgivningsdatum: 2008-04-01
- Förlag: World Scientific Publishing Co Pte Ltd