Vetenskap & teknik
The Source/Drain Engineering of Nanoscale Germanium-based MOS Devices
Zhiqiang Li
Inbunden
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This book mainly focuses on reducing the high parasitic resistance in the source/drain of germanium nMOSFET. With adopting of the Implantation After Germanide (IAG) technique, P and Sb co-implantation technique and Multiple Implantation and Multiple Annealing (MIMA) technique, the electron Schottky barrier height of NiGe/Ge contact is modulated to 0.1eV, the thermal stability of NiGe is improved to 600 and the contact resistivity of metal/n-Ge contact is drastically reduced to 3.8107cm2, respectively. Besides, a reduced source/drain parasitic resistance is demonstrated in the fabricated Ge nMOSFET. Readers will find useful information about the source/drain engineering technique for high-performance CMOS devices at future technology node.
- Illustratör: Bibliographie 6 schwarz-weiße und 75 farbige Abbildungen
- Format: Inbunden
- ISBN: 9783662496817
- Språk: Engelska
- Antal sidor: 59
- Utgivningsdatum: 2016-06-22
- Förlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. K