bokomslag VLSI Test Principles and Architectures
Vetenskap & teknik

VLSI Test Principles and Architectures

Laung-Terng Wang

Inbunden

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  • 808 sidor
  • 2006
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.


  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
  • Författare: Laung-Terng Wang
  • Format: Inbunden
  • ISBN: 9780123705976
  • Språk: Engelska
  • Antal sidor: 808
  • Utgivningsdatum: 2006-08-01
  • Förlag: Morgan Kaufmann