bokomslag High Resolution X-Ray Diffractometry And Topography
Vetenskap & teknik

High Resolution X-Ray Diffractometry And Topography

D K Bowen Brian K Tanner

Pocket

1239:-

Funktionen begränsas av dina webbläsarinställningar (t.ex. privat läge).

Uppskattad leveranstid 10-16 arbetsdagar

Fri frakt för medlemmar vid köp för minst 249:-

Andra format:

  • 264 sidor
  • 2019
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
  • Författare: D K Bowen, Brian K Tanner
  • Format: Pocket/Paperback
  • ISBN: 9780367400637
  • Språk: Engelska
  • Antal sidor: 264
  • Utgivningsdatum: 2019-10-10
  • Förlag: CRC Press