Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science 1
bokomslag Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Vetenskap & teknik

Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Sarah Fearn

Pocket

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Andra format:

  • 2015
  • Författare: Sarah Fearn
  • Format: Pocket/Paperback
  • ISBN: 9781681740249
  • Språk: Engelska
  • Utgivningsdatum: 2015-10-30
  • Förlag: Morgan & Claypool Publishers

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