bokomslag Noncontact Atomic Force Microscopy
Vetenskap & teknik

Noncontact Atomic Force Microscopy

S Morita Roland Wiesendanger E Meyer

Inbunden

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  • 440 sidor
  • 2002
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
  • Författare: S Morita, Roland Wiesendanger, E Meyer
  • Illustratör: dav 5 farb 299 Abb
  • Format: Inbunden
  • ISBN: 9783540431176
  • Språk: Engelska
  • Antal sidor: 440
  • Utgivningsdatum: 2002-07-01
  • Förlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. K