Vetenskap & teknik
Pocket
Noncontact Atomic Force Microscopy
S Morita • Roland Wiesendanger • E Meyer
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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
- Format: Pocket/Paperback
- ISBN: 9783642627729
- Språk: Engelska
- Antal sidor: 440
- Utgivningsdatum: 2012-10-23
- Förlag: Springer-Verlag Berlin and Heidelberg GmbH & Co. K