Positron Annihilation in Semiconductors

Defect Studies

Häftad, Engelska, 2010

Av Reinhard Krause-Rehberg, Hartmut S. Leipner

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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.

Produktinformation

Utgivningsdatum2010-12-01
Mått155 x 235 x 47 mm
Vikt626 g
FormatHäftad
SpråkEngelska
SerieSpringer Series in Solid-State Sciences
Antal sidor383
FörlagSpringer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN9783642084034

Tillhör följande kategorier

1 Introduction.- 2 Experimental Techniques.- 3 Basics of Positron Annihilation in Semiconductors.- 4 Defect Characterization in Elemental Semiconductors.- 5 Defect Characterization in III–V Compounds.- 6 Defect Characterization in II–VI Compounds.- 7 Defect Characterization in Other Compounds.- 8 Applications of Positron Annihilation in Defect Engineering.- 9 Comparison of Positron Annihilation with Other Defect-Sensitive Techniques.- A1 Semiconductor Data.- A2 Trapping Model Equations.- References.