Thermal-Aware Testing of Digital VLSI Circuits and Systems 1

Data & IT

Thermal-Aware Testing of Digital VLSI Circuits and Systems

Name: Thermal-Aware Testing of Digital VLSI Circuits and Systems
Price: 449 SEK
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Author: Santanu Chattopadhyay
ISBN: 9780367607098

Santanu Chattopadhyay

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118 sidor
2020

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

Författare: Santanu Chattopadhyay
Format: Pocket/Paperback
ISBN: 9780367607098
Språk: Engelska
Antal sidor: 118
Utgivningsdatum: 2020-06-30
Förlag: CRC Press