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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
- Illustratör: black and white 10 Illustrations
- Format: Inbunden
- ISBN: 9780815378822
- Språk: Engelska
- Antal sidor: 118
- Utgivningsdatum: 2018-04-25
- Förlag: CRC Press Inc