bokomslag Thermal-Aware Testing of Digital VLSI Circuits and Systems
Data & IT

Thermal-Aware Testing of Digital VLSI Circuits and Systems

Santanu Chattopadhyay

Inbunden

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  • 118 sidor
  • 2018
This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips
  • Författare: Santanu Chattopadhyay
  • Illustratör: black and white 10 Illustrations
  • Format: Inbunden
  • ISBN: 9780815378822
  • Språk: Engelska
  • Antal sidor: 118
  • Utgivningsdatum: 2018-04-25
  • Förlag: CRC Press Inc